Mgr. Oleksandr Romanyuk, Ph.D.
- Condensed matter physics
- +420 220 318 495
- Max fellows: 1
- Scientific topic
- Equipment and laboratories
- Publications
- Projects
- Areas of expertise
New methodological approaches are being developed to address the current limitations in quantitative analysis of materials using photoelectron spectroscopy. These advancements include the application of femtosecond lasers for depth-profiling by XPS, preparation and modification of hybrid core-shell nanoparticles, and implementation of machine learning algorithms, enabling more accurate deconvolution of XPS spectra.
I work at the Institute of Physics of the Czech Academy of Sciences.
Equipment
AXIS Supra X-ray photoelectron spectrometer equipped with AlKα and AgLα X-ray sources, Ar cluster ion beam sputtering for depth profiling, laser-ablation XPS, in-situ annealing, AR XPS, UPS, ISS, REELS. Collaboration with other laboratories in FZU: SEM, AFM, femto-second lasers, deposition by CVD, MOVPE, MBE, ALD, magnetron.
